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025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 5
5º Back Angle: 1 - 14 Side Angle: 22
Suitable for electrical characterization with PeakForce TUNA
5 Tip Radius (Nom): 1 Tip Radius (Max): 2 Tip Set Back (Nom): 1
Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air
SCM-PIT-V2 8 N/m 025 Ωcm Antimony (n) dopedConductive Probes, 3N m, 75kHz, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker's new SCM PIT V2 probe replaces the legacy SCM PIT probe. Built on the high performance RFESP 75 AFM probe, Bruker's SCM PIT V2 probe has a Platinum Iridium coated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical
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