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Au coated tips
They deliver extreme imaging speed without loss of resolution
Observation of rugged samples:The tip is thin with the tip angle of 35 degrees
Periodically poled lithium niobate (PPLN)
high-amplitude force imaging in air
VGRP-UM Unmounted Instrument Au coated tipsCalibration artifact: 180nm step height, 10m pitch DESCRIPTION Calibration artifact, 180nm step height, 10m pitch. This Bruker SurfaceTopography Reference Dies have a variety of step heights and pitches fordaily monitoring of SPM performance. The silicon die with patternedlayer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST. Replaces model STR10 1800P.
US$ 35.00
US$ 35.00
US$ 35.00
