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Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM
handling of magnetic and electronic parts
6 Cantilever Geometry: Rectangular & Triangular Cantilevers Number: 6 Back Side Coating: Drift Compensated Reflective Gold
The legacy MESP-HM is still available for ordering while supplies last
G1000HS: Pitch 25µm
DUMONT High Precision Grade Tweezers 0c Round Electrostatic Force Microscopy (EFM) probeDESCRIPTION SS, NM SS, PTFE coated SS, CS. Available in 16 styles and many finishes. Suitable for most general laboratory use. SS= stainless steel, NM SS= non magnetic stainless steel DUMONT High Precision Tweezers for electron microscopy, electronics, forensics, histology, and general laboratory use. Includes fine pointed, strong, PTFE coated, slim, short and cutting tweezers. Prod # Description Style Length Metal Points Width x Thickness 5614 DUMONT
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