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ContGD-G Select Quantity:50 per set 00 silicon cantilever for non-contact-

SKU: 40199212820

4.5
EUR223.40 EUR266.40

Pay in 4 interest-free payments of $55.85 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 2 - Aug 7

Description

00 silicon cantilever for non-contact- / tapping-mode

9mm Mica Discs attached

thin silver plated copper wires connected to the Al and Au contact pads

We offer two retainer & mounting options

Can also be used to safely store FIB grids with thin section (lamellae) attached to them

ContGD-G Select Quantity:50 per set 00 silicon cantilever for non-contact-Gold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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