PELCO® Multiple FIB Grid Holder 40 kHz CP-II DESCRIPTION

CP-II DESCRIPTION

"Interface characteristics of vertically aligned carbon nanofibers for interconnect applications"

positively charged surfaces: Hayat

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PELCO® Multiple FIB Grid Holder 40 kHz CP-II DESCRIPTIONDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain