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electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM)
HOPG is often used asa standard testing sample for Scanning Tunneling Microscopy (STM)
overhang) and largevolumeproduction to undercut applications
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-300
14mm in length
VITA-MM-NANOTA-200 All electrically conductive tip that isVITA NanoTa, 200um, 0. 5 3. 0N m, 55 80kHz DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS NanoTA probes for MultiMode SPMs, 200 micron length. Note: Requires specialized probe holder model VITA CH MM. If using newerHigh Efficiency probe holder model VITA CH MM HE, then probe model VITA HE NANOTA 200 is required instead. Specifically designed for use with VITA module. Uses other than with VITA module void probe warranty. Probes are micro
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