SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm CAFM or SSRM DESCRIPTION

CAFM or SSRM DESCRIPTION

Hole: 115 microns

5 Tip Radius (Nom): 20 Tip Radius (Max): 60 Tip Set Back (Nom): 4 Tip Set Back( RNG): 0 - 7

5KHZ DESCRIPTION

Styles available are Square Mesh

SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm CAFM or SSRM DESCRIPTIONDESCRIPTION MRS 4 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron